The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
May. 18, 2023
Applicant:
Ecopia Tech Corporation, Toronto, CA;
Inventors:
Yuanming Shu, Toronto, CA;
Shuo Tan, Campbell, CA (US);
Zihao Chen, Toronto, CA;
Ruijie Deng, Toronto, CA;
Assignee:
Ecopia Tech Corporation, Toronto, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06T 17/05 (2011.01); G06T 17/10 (2006.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
G06T 17/05 (2013.01); G06T 7/60 (2013.01); G06T 17/10 (2013.01); G06V 20/176 (2022.01); G06T 2210/04 (2013.01); G06V 2201/12 (2022.01);
Abstract
Methods and systems for determining the height of structures based on imagery of the structures and associated two-dimensional vector data are provided. An example method involves projecting two-dimensional vector data outlining a roof of a structure into images of the structure captured from different perspectives and feature matching the vector data across the imagery to determine a best-matching three-dimensional position for the roof situated at the height of the structure.