The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jul. 14, 2021
Yale University, New Haven, CT (US);
Yale University, New Haven, CT (US);
Abstract
A system based upon artificial neural networks generates attenuation-corrected SPECT from non-attenuation-corrected SPECT (single photon emission computed tomography) without or with an intermediate step of attenuation map estimation. The system includes a SPECT scanner with CZT cameras for dynamic SPECT imaging. The system also includes a machine learning system including a 3D Dual Squeeze-and-Excitation Residual Dense Network for generating attenuation-corrected SPECT or attenuation maps from non-attenuation-corrected SPECT. The machine learning system reconstructs images from photopeak window and one or more scatter windows of the SPECT scanner are fed to the 3D Dual Squeeze-and-Excitation Residual Dense Network to generate attenuation-corrected SPECT or attenuation maps.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile