The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jan. 18, 2023
Applicant:
Industrial Technology Research Institute, Hsinchu, TW;
Inventors:
Assignee:
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01B 11/00 (2006.01); G06T 7/73 (2017.01); G06T 7/90 (2017.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06T 7/90 (2017.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30204 (2013.01);
Abstract
A measurement system includes a camera and a processor. The camera is configured to capture a measurement card image of a measurement card, and the measurement card image includes a number of feature pattern images. The processor is electrically connected to the camera and configured for analyzing the feature pattern images to obtain a feature point coordinate of a feature point of each feature pattern image, and inputting the feature point coordinates into a conversion matrix to obtain a tip coordinate of a tip of the measurement card.