The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Dec. 21, 2022
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Xiaolan Liu, Beijing, CN;

Yaan Ge, Beijing, CN;

Qingyu Dai, Beijing, CN;

Kun Wang, Beijing, CN;

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01R 33/56 (2006.01); G06N 20/00 (2019.01); G06T 5/70 (2024.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G01R 33/56 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A method for magnetic resonance image quality assessment is provided. The method includes acquiring a magnetic resonance image; processing the magnetic resonance image to extract image parameters associated with a preset metric; and determining, on the basis of the image parameters, an image quality assessment result associated with the corresponding metric.


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