The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Jun. 07, 2023
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Yujiao Cheng, Fremont, CA (US);

Tetsuaki Kato, Fremont, CA (US);

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06V 10/82 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A method and system for anomaly detection from object images. A feature extractor provides feature data characterizing part images, including good parts and bad parts. Training data for good parts is used to create a k-nearest neighbors (k-NN) model core set. The feature data includes hundreds of feature vectors, each having hundreds of filter dimensions. A weight value of one is initially assigned to each filter, and test data comprising some good and some bad parts is evaluated by a weighted k-NN module to determine an anomaly score from the weighted feature data. After all test images are evaluated, good and bad data points nearest a threshold are selected and a gradient ascent computation is performed to update the filter weights. Anomaly scoring and gradient ascent are performed iteratively until filter weights are identified which maximize the separation between good and bad scores, thereby eliminating missed detections and false anomalies.


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