The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jun. 17, 2022
Hitachi, Ltd., Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention includes image acquiring for acquiring an inspection image of a target object, pass/fail determining for determining whether the inspection image acquired in the image acquiring is the inspection image of a non-defect candidate or the inspection image of a defect candidate, overdetection determining for determining whether the inspection image determined as a defect candidate in the pass/fail determining is the inspection image of overdetection or the inspection image of non-overdetection which is not overdetection, non-defect estimation parameter learning for learning a non-defect estimation parameter used in the pass/fail determining using a learning non-defect image acquired in the image acquiring, and overdetection determination parameter learning for learning an overdetection determination parameter used in the overdetection determining using the learning non-defect image.