The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Mar. 20, 2024
Korea Institute of Science & Technology Information, Daejeon, KR;
Su Min Seo, Seoul, KR;
Jeong Eun Byun, Seoul, KR;
Kuk Jin Bae, Seongnam-si, KR;
Yun Jeong Choi, Seoul, KR;
Eun Sun Kim, Seoul, KR;
Min Je Cho, Seoul, KR;
Sung Jin Kim, Incheon, KR;
Ju Yeon Shin, Yongin-si, KR;
Ji Min Kim, Yongin-si, KR;
Min Ju Kim, Seoul, KR;
KOREA INSTITUTE OF SCIENCE & TECHNOLOGY INFORMATION, Daejeon, KR;
Abstract
The present disclosure relates to a method of deriving quality improvement requirements. The method according to some embodiments may include receiving a plurality of evaluation information for a first product from an evaluation information database, inputting the plurality of evaluation information into a key phrase extraction model and determining key phrases for the plurality of evaluation information based on an output of the key phrase extraction model, grouping some of the key phrases for the plurality of evaluation information into multiple groups and storing information on each of the multiple groups in a memory, ranking the key phrases included in each of the multiple groups and storing information associated with the ranks of the key phrases included in each of the multiple groups in the memory and determining top n key phrases from each of the multiple groups as quality improvement requirements.