The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Feb. 18, 2022
Applicant:

Hitachi Solutions, Ltd., Tokyo, JP;

Inventors:

Yuxin Liang, Tokyo, JP;

Masashi Egi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/21 (2023.01); G06F 3/0482 (2013.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2185 (2023.01); G06F 3/0482 (2013.01); G06F 18/214 (2023.01);
Abstract

A computer system accurately selects learning data for improving a prediction accuracy of a predictor, and is connected to a database that stores a plurality of pieces of learning data and information for managing a plurality of predictors generated under different learning conditions. A target predictor is selected, an influence degree representing strength of an influence of the learning data on a prediction accuracy of the target predictor for test data is calculated for each of a plurality of pieces of test data, an influence score of the learning data is calculated for the plurality of predictors based on a plurality of influence degrees of the learning data associated with the predictors, and the learning data to be used is selected from the plurality of pieces of learning data on the basis of a plurality of the influence scores of each of the plurality of pieces of learning data.


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