The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jun. 05, 2024
Applicants:
Inventec (Pudong) Technology Corporation, Shanghai, CN;
Inventec Corporation, Taipei, TW;
Inventors:
Assignees:
Inventec (Pudong) Technology Corporation, Shanghai, CN;
INVENTEC CORPORATION, Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01);
Abstract
The present disclosure provides a functional metadata method for data quality inspection, which includes steps as follows. Based on historical data, the functional metadata is established, where the functional metadata includes an acceptable pattern, a data distribution and a data definition; according to the functional metadata, at least one of a detection of the acceptable pattern, a detection of the data distribution and a detection of the data definition is performed on a data content, so as to obtain a detection result.