The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Dec. 16, 2022
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Scott Matthew King, Parksville, CA;

Justin Wayne Callison, Vancouver, CA;

Jalandip Lepcha, Vancouver, CA;

Daniel James Ronald, Vancouver, CA;

Feng Qiu, Calgary, CA;

Diego Raphael Pedroza Santiviago, Burnaby, CA;

Gabriel Howard Mastey, North Vancouver, CA;

Maury Richard Sponchia, Delta, CA;

Russell William Mackenzie, Bowen Island, CA;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/50 (2006.01); G06F 9/48 (2006.01);
U.S. Cl.
CPC ...
G06F 9/5038 (2013.01); G06F 9/4881 (2013.01);
Abstract

System and methods are provided for dynamically parallelized large data set processing. A workflow includes a distributed map state. A set of steps in the distributed map state are run for each item in a collection of items or for each batch. Execution of the distributed map state is dynamically parallelized such that the system creates as many parallel workflows as there are items in the collection at run time (or batches). The items in the collection are dynamically determined by the workflow system, as defined by a resource in the distributed map state.


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