The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Jul. 18, 2025
Applicants:

Alexander Perez-pons, Miami, FL (US);

Sebastian DE LA Cruz, Miami, FL (US);

Inventors:

Alexander Perez-Pons, Miami, FL (US);

Sebastian De La Cruz, Miami, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 9/455 (2018.01); G06F 11/3698 (2025.01);
U.S. Cl.
CPC ...
G06F 9/45558 (2013.01); G06F 11/3698 (2025.01); G06F 2009/45562 (2013.01); G06F 2009/45591 (2013.01);
Abstract

Systems and methods for transforming program control flow data into space-filling curves for anomaly detection are provided. A system includes emulating a microcontroller (MCU) in a virtual environment, mapping program control flow data onto a Hilbert space-filling curve to preserve execution locality and applying a convolutional neural network (CNN) to identify anomalies in the resulting spatial representation. The approach improves embedded system security by enabling efficient evaluation of control flow behavior.


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