The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Jun. 05, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Kotaro Sanai, Tokyo, JP;

Emi Yoneda, Tokyo, JP;

Masayo Nakagawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 2219/32179 (2013.01);
Abstract

An abnormality symptom analyzing device comprises: a data request receiver to perform request and reception of data, required for analyzing an abnormality symptom(s), including measurement information obtained from a sensor(s) of a facility, an abnormality symptom(s) detected from the measurement information and inspection information of the facility; a data storage device to store the data acquired by the data request receiver; a coordination circuitry to perform the registration of data to display a screen display component(s) on a display device and the correspondence of data coordinated between screen display components to a screen display component(s) coordinated, and to store information modified according to input contents from an input device, whereby modification contents are coordinated to the screen display components; and a component graphics-drawing management circuitry to acquire data through the coordination circuitry, and to display details information of the facility and propagation information of an abnormality symptom(s) in signals.


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