The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jul. 29, 2021
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Hirotaka Oka, Tokyo, JP;
Masumi Nomura, Tokyo, JP;
Tatsuo Ishiguro, Tokyo, JP;
Katsuaki Morita, Tokyo, JP;
Ryuji Ikeda, Tokyo, JP;
Kenichi Nagahara, Tokyo, JP;
Sota Kogawa, Tokyo, JP;
Noriyuki Matsukura, Tokyo, JP;
Satoshi Nikaido, Tokyo, JP;
Yuki Nishizaki, Tokyo, JP;
Abstract
An estimation device includes an observation system constraint determination unit configured to determine data within constraints that is data within a first constraint based on time series data of each observation value of a first observation value observed by a first observation system and a second observation value observed by a second observation system, a model estimation unit configured to estimate parameters of a plurality of models including an observation model that is a model of each of the observation systems and a physical model that is a model within an apparatus provided with each of the observation systems based on the data within constraints, and a consistency determination unit configured to determine consistency of the models based on a deviation between a first predicted observation value predicted from the second observation system based on the estimated parameters and the first observation value.