The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Nov. 17, 2023
Zhejiang University, Zhejiang, CN;
Cuifang Kuang, Hangzhou, CN;
Yuxuan Qiu, Hangzhou, CN;
Yusen Zhang, Hangzhou, CN;
Xu Liu, Hangzhou, CN;
ZHEJIANG UNIVERSITY, Hangzhou, CN;
Abstract
A confocal scanning dark field microscopy imaging method and device, comprising: modulating a phase of a laser beam emitted by a laser into a 0-2π π vortex phase, where n>3; conjugating the modulated laser beam with an entrance pupil of an objective lens of a confocal scanning microscope, so that a focusing spot of the objective lens is a hollow spot, and an inner ring radius of the hollow spot is greater than a radius of a solid spot without phase modulation; and enabling the confocal scanning microscope to work, thereby achieving dark field microscopy imaging. The present disclosure adopts a confocal design with a pore placed in front of the detector. The plane of the pore is conjugated with the object plane, blocking a defocusing signal from entering the detector.