The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Dec. 14, 2023
Applicant:

Riken, Saitama, JP;

Inventor:

Takashi Kameshima, Hyogo, JP;

Assignee:

RIKEN, Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01); G01T 1/202 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2018 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01T 1/2023 (2013.01);
Abstract

A control unit of a radiation imaging apparatus includes: an exposure time control unit which controls a subframe exposure time of an image sensor such that focused fluorescence at a depth of field generated by radiation reaching a scintillator and out-of-focus fluorescence deviating from the depth of field are discretely imaged on a light receiving surface of the image sensor for each particle of the radiation; a focused signal discrimination unit which discriminates between sensor signals of a light receiving pixel group corresponding to spots of the focused fluorescence discretely included in each subframe and sensor signals of a light receiving pixel group corresponding to spots of the out-of-focus fluorescence; and an image signal processing unit which generates an image by overlaying subframe data based on the sensor signals from the light receiving pixel group corresponding to the spots of the focused fluorescence.


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