The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Aug. 11, 2023
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Julian Harms, Munich, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
The present disclosure relates to a test and/or measurement system. The test and/or measurement system comprises a base unit which comprises: an LO signal source configured to generate an LO signal, a first LO port and a second LO port, wherein the LO signal source is connected to the first LO port and the second LO port, and an LO measurement device. The test and/or measurement system further comprises: a first external frontend which is connected to the first LO port of the base unit via a first cable, and which is configured to receive a first fraction of the LO signal from the first LO port, wherein the first external frontend comprises one or more calibration standards; and a second external frontend which is connected to the second LO port of the base unit via a second cable, and which is configured to receive a second fraction of the LO signal from the second LO port, wherein the second external frontend comprises one or more calibration standards. The test and/or measurement system is operable in a calibration mode in which: the first external frontend is configured to connect the first LO port with one of its one or more calibration standards, the second external frontend is configured to connect the second LO port with one of its one or more calibration standards, and the LO measurement device is configured to measure: the LO signal which is generated by the LO signal source, a reflection of the first fraction of the LO signal received at the first LO port, and a reflection of the second fraction of the LO signal received at the second LO port.