The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Sep. 15, 2023
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Kevin Bell, Vestal, NY (US);

Gerald K. Mletzko, Jr., Pine City, NY (US);

Gibson Richard Garner, Marietta, GA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/20 (2006.01); G01R 1/28 (2006.01); G01R 15/14 (2006.01); G01R 31/00 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 1/203 (2013.01); G01R 1/28 (2013.01); G01R 15/144 (2013.01); G01R 31/005 (2013.01); G01R 31/2621 (2013.01); G01R 31/2632 (2013.01);
Abstract

According to some embodiments, a computer-implemented method is applied to calibrate a wireless test module (WTM) of a wireless harness automated measurement system (WHAMS) using a computer server and a calibration fixture. The WTM includes a plurality of field effect transistors (FETs). The calibration fixture includes a plurality of resistors. The method measures, using the calibration fixture, a first/second resistance value of the plurality of FETs from a first/second internal measurement test for the WTM. The method determines a resistance calibration value by subtracting the first resistance value from the second resistance value. The method measures a plurality of calibration factors to determine a measured resistor value for a target resistor value for a respective resistor of the calibration fixture.


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