The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jul. 27, 2022
The Regents of the University of Michigan, Ann Arbor, MI (US);
Uchicago Argonne, Llc, Chicago, IL (US);
Dow Global Technologies Llc, Midland, MI (US);
Robert Hovden, Ann Arbor, MI (US);
Jonathan Schwartz, Ann Arbor, MI (US);
Yi Jiang, Lemont, IL (US);
Zichao Wendy Di, Darien, IL (US);
Steven J. Rozeveld, Midland, MI (US);
Huihuo Zheng, Glen Ellyn, IL (US);
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
UCHICAGO ARGONNE, LLC, Chicago, IL (US);
DOW GLOBAL TECHNOLOGIES LLC, Midland, MI (US);
Abstract
Systems and methods for fused multi-modal electron microscopy are provided to generate quantitatively accurate 2D maps or 3D volumes with pixel/voxel values that directly reflect a sample's chemistry. Techniques are provided for combining annular dark field detector (ADF), annular bright field (ABF) and/or pixelated detector image data and energy dispersive X-rays (EDX) data and/or electron energy loss spectroscopy (EELS) data for a sample and generating chemical 2D and 3D maps by applying minimization optimization process.