The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jun. 27, 2022
Applicant:
Hamamatsu Photonics K.k., Hamamatsu, JP;
Inventor:
Hisaya Hotaka, Hamamatsu, JP;
Assignee:
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); G01N 23/046 (2013.01);
Abstract
An X-ray focal spot shape evaluation apparatus is an apparatus for evaluating an X-ray focal spot shape including an X-ray focal spot size on a target of an X-ray source, and includes an imaging unit and an operation unit. The imaging unit acquires a phase contrast image in a range including an edge of an object disposed on a propagation path of X-rays generated on the target of the X-ray source. The operation unit evaluates the X-ray focal spot shape on the target based on at least the phase contrast image, a linear attenuation coefficient of the object, and a refractive index of the object.