The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Aug. 04, 2022
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Daisuke Hagihara, Kyoto, JP;
Taiki Nishimura, Kyoto, JP;
Tohru Matsuura, Kyoto, JP;
Shota Maki, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06F 11/22 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G06F 11/2294 (2013.01); H04N 7/183 (2013.01); G01N 2021/8887 (2013.01);
Abstract
This management device for a material testing machine includes: an acquisition unit that acquires at least either a captured image of a material testing machine body or a captured image of a control device that causes the material testing machine body to execute a test; and a data-processing unit that associates the captured image with the material testing machine and stores a result in an image storage unit.