The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Mar. 28, 2024
Mloptic Corp, Redmond, WA (US);
Pengfei Wu, Bellevue, WA (US);
Wei Zhou, Sammamish, WA (US);
Wei Wang, Nanjing, CN;
Yongshui Cai, Nanjing, CN;
MLOptic Corp., Redmond, WA (US);
Abstract
A wavefront tester for measuring the wavefront of a sample via an optical path, the wavefront tester including a mirror, an imaging lens, an aperture, a beam splitter, a wavefront sensor, a lens selection system including a plurality of optical lenses, a suitable optical lens of which is commensurate with the sample and selected to be disposed in the optical path and a light source directed in a first direction through the optical path by the beam splitter through the suitable optical lens and the sample to the mirror such that the light source is redirected in a second direction opposite the first direction through the optical path and the beam splitter, the aperture and the imaging lens to be received at the wavefront sensor.