The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Feb. 21, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Ryo Ikeuchi, Otsu, JP;

Koji Takatori, Moriyama, JP;

Takahiro Nakamura, Ritto, JP;

Hironori Ogawa, Kyoto, JP;

Tadahiko Ogawa, Ritto, JP;

Akira Takaishi, Moriyama, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2022.01); G01J 5/02 (2022.01); G01J 5/04 (2006.01); G01J 5/56 (2006.01); H02B 1/32 (2006.01);
U.S. Cl.
CPC ...
G01J 5/0096 (2013.01); G01J 5/00 (2013.01); G01J 5/027 (2013.01); G01J 5/046 (2013.01); G01J 5/56 (2013.01); H02B 1/32 (2013.01);
Abstract

A temperature abnormality detection device includes a plurality of infrared temperature sensors respectively capable of detecting temperature in a different detection area of an equipment, and a device body including a temperature abnormality determination unit that determines that the temperature in the detection area detected by each of the plurality of infrared temperature sensors is abnormal when the temperature in the detection area is higher than a reference temperature. The plurality of infrared temperature sensors is connected to each other by crossover wiring.


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