The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Dec. 19, 2023
Applicant:

Datalogic Ip Tech, S.r.l., Bologna, IT;

Inventors:

Paolo Tosato, Bologna, IT;

Gianluca Sirigu, Cagliari, IT;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01V 8/12 (2006.01);
U.S. Cl.
CPC ...
G01B 11/06 (2013.01); G01V 8/12 (2013.01);
Abstract

A system including at least one apparatus that measures thicknesses of objects. The apparatus includes a first emitter, a second emitter, a first receiver, and a second receiver. The first emitter and the second receiver are positioned diagonally opposed across a plane, and the second emitter and the first receiver are positioned diagonally opposed across the plane. The first receiver receives a first signal emitted by the first emitter after reflecting off of an object occupying the plane. The second receiver is positioned to receive a second signal emitted by the second emitter after reflecting off of the object. The apparatus includes a circuitry operable to determine the thickness of the object based on reflections of the first signal and the second signal.


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