The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Feb. 06, 2024
Applicant:
Honeywell International Inc., Charlotte, NC (US);
Inventors:
Jan Pekarek, Brno, CZ;
Zbynek Drasal, Prague, CZ;
Lucas N. Taylor, Minneapolis, MN (US);
Robert Mark, Minnetonka, MN (US);
Mikulas Jandak, Kol⋅⋅n, CZ;
Assignee:
Honeywell International Inc., Charlotte, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02055 (2022.01); G01S 7/481 (2006.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01B 9/02072 (2013.04); G01S 7/4816 (2013.01); G01S 7/4818 (2013.01); G01S 17/931 (2020.01); G01B 2290/25 (2013.01);
Abstract
Techniques are provided for symmetrically locating optical emitters in a surface of a ferrule. Such symmetrical displacement of each pair of optical emitters diminishes differences in path lengths through which optical signals propagate in an optical interferometer with tilted input and/or output surfaces.