The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Aug. 30, 2022
Applicant:

Kennametal Inc., Latrobe, PA (US);

Inventors:

Zhenyu Liu, Greensburg, PA (US);

Kimaya Prakash Vyavhare, Irwin, PA (US);

Assignee:

KENNAMETAL INC., Latrobe, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/40 (2006.01); B23B 27/14 (2006.01); C23C 16/02 (2006.01); C23C 16/34 (2006.01); C23C 16/36 (2006.01);
U.S. Cl.
CPC ...
C23C 16/403 (2013.01); B23B 27/148 (2013.01); C23C 16/0272 (2013.01); C23C 16/34 (2013.01); C23C 16/36 (2013.01); B23B 2228/10 (2013.01);
Abstract

In one aspect, cutting tools are described herein comprising wear resistant coatings employing one or more refractory layers of polycrystalline α-AlO. Briefly, a coated cutting tool described herein comprises a substrate, and a coating adhered to the substrate, the coating comprising a layer of polycrystalline α-AlOdeposited by chemical vapor deposition (CVD), wherein at least 5% of all grain boundaries in the polycrystalline α-AlOlayer have a misorientation angle less than 15 degrees as determined using a field-emission scanning electron microscope (FESEM) and an electron backscatter diffraction (EBSD) detector.


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