The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Aug. 14, 2020
Applicant:
Denka Company Limited, Tokyo, JP;
Inventors:
Tomohiro Nomiyama, Tokyo, JP;
Manabu Kobayashi, Tokyo, JP;
Masaru Miyazaki, Tokyo, JP;
Tatsuya Okuzono, Tokyo, JP;
Assignee:
DENKA COMPANY LIMITED, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C09K 11/77 (2006.01); C09K 11/57 (2006.01); C09K 11/61 (2006.01); H10H 20/851 (2025.01); H10K 50/125 (2023.01);
U.S. Cl.
CPC ...
C09K 11/7734 (2013.01); C09K 11/57 (2013.01); H10H 20/851 (2025.01); H10K 50/125 (2023.02);
Abstract
A europium-doped β-sialon phosphor particle. When the element concentration of a Si atom on the surface portion of the particle that is obtained by analyzing a cross section of the phosphor particle by the energy dispersive X-ray analysis method is indicated by Ps [at %], and the element concentration of a Si atom near the center of the particle that is obtained by an analysis by the same method is indicated by Pc [at %], the Pc-Ps value is 3 at % or more.