The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Sep. 12, 2024
Applicant:

GE Precision Healthcare Llc, Waukesha, WI (US);

Inventors:

Hani Nozari Mirar, Oslo, NO;

Stian Langeland, Vollen, NO;

Sten Roar Snare, Bekkestua, NO;

Assignee:

GE Precision Healthcare LLC, Waukesha, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 8/486 (2013.01); A61B 8/0883 (2013.01); A61B 8/461 (2013.01); A61B 8/485 (2013.01); A61B 8/5223 (2013.01); A61B 8/5284 (2013.01); A61B 2576/023 (2013.01);
Abstract

Various systems and methods are provided for determining information related to cardiac deformation of a region of interest of a heart of a subject using deformation imaging based on a delineation of the cardiac cycle of the heart of the subject determined from imaging data. The imaging data of the region of interest of the heart of the subject may be received. A set of mechanical events of the heart of the subject may be detected based on analyzing the imaging data. The delineation of the cardiac cycle may be determined based on the set of mechanical events of the heart of the subject. The information related to cardiac deformation of the region of interest of the heart of the subject may be determined using deformation imaging based on the delineation of the cardiac cycle. The information related to cardiac deformation of the region of interest may be displayed.


Find Patent Forward Citations

Mirar, Hani. (2025). System and method for real-time correction of strain traces in patients with conduction delays (U.S. Patent No. 12496044). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12496044

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