The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jan. 19, 2024
Fujifilm Healthcare Corporation, Chiba, JP;
Kazuki Matsuzaki, Chiba, JP;
Isao Takahashi, Chiba, JP;
Keisuke Yamakawa, Chiba, JP;
Tadashi Nakamura, Chiba, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided is an X-ray imaging apparatus that can understand a three-dimensional position of a treatment tool in real time during a medical operation without rotating a column of an X-ray tube. A first X-ray image is acquired by irradiating a subject with X-rays from a first X-ray tube supported by a first column and detecting the X-rays transmitted through the subject by an X-ray detector. A second X-ray image is acquired by irradiating the subject with X-rays from a second X-ray tube supported by a second column at a position shifted from an optical axis of the first X-ray tube and detecting the X-rays transmitted through the subject by the X-ray detector. A position of an image of a predetermined feature part included in the first X-ray image and a position of an image of the feature part included in the second X-ray image are used to calculate a three-dimensional position of the image of the predetermined feature part.