The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Feb. 02, 2021
Methods and systems for inspecting the alignment of the eye in an ophthalmological imaging apparatus
Imagine Eyes, Orsay, FR;
Nicolas Lefaudeux, Forges-les-Bains, FR;
Xavier Levecq, Gif sur Yvette, FR;
Imagine Eyes, Orsay, FR;
Abstract
A method for controlling alignment of an eye in an ophthalmological imaging device that includes a formation, on a two-dimensional detection plane, of an image of an element located in a plane of the pupil of the eye using an imaging optical element. The method further includes a determination of a lateral position of the pupil of the eye with respect to a point of origin of a reference frame of an imaging system in the eye space based on the position of the image in the detection plane. The method further includes an analysis of a state of focus of the image in two regions of the detection plane. The method further includes a determination of an axial position of the pupil of the eye with respect to the point of origin of the reference frame based on the analysis of the state of focus.