The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Mar. 08, 2024
Applicant:

Beijing Dajia Internet Information Technology Co., Ltd., Beijing, CN;

Inventors:

Che-Wei Kuo, San Diego, CA (US);

Xiaoyu Xiu, San Diego, CA (US);

Wei Chen, San Diego, CA (US);

Xianglin Wang, San Diego, CA (US);

Yi-Wen Chen, San Diego, CA (US);

Hong-Jheng Jhu, San Diego, CA (US);

Ning Yan, San Diego, CA (US);

Bing Yu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/00 (2014.01); H04N 19/105 (2014.01); H04N 19/124 (2014.01); H04N 19/186 (2014.01); H04N 19/44 (2014.01);
U.S. Cl.
CPC ...
H04N 19/44 (2014.11); H04N 19/105 (2014.11); H04N 19/124 (2014.11); H04N 19/186 (2014.11);
Abstract

An electronic apparatus performs a method of decoding video signal, including: receiving, from the video signal, a picture frame that includes a first component, and a second component; selecting an edge direction across a collocated sample of the first component or a current sample of the second component relative to the respective sample of the second component; calculating a first edge strength determining a difference between values of two samples from the group consisting of the collocated or current sample, a first neighbouring sample, and a second neighbouring sample; quantizing the first edge strength into M segments according to M−1 threshold values; determining the classifier for the respective sample of the second component based on the M segments; determining a sample offset for the respective sample of the second component according to the classifier; and modifying the respective sample of the second component based on the determined sample offset.


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