The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Mar. 11, 2024
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Christian Lemler, Livermore, CA (US);

Christopher Huang, Santa Clara, CA (US);

Brian Sunter, San Francisco, CA (US);

Richard Stanley, Oakland, CA (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/085 (2022.01); G06F 16/23 (2019.01); H04L 41/22 (2022.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
H04L 41/085 (2013.01); G06F 16/2358 (2019.01); G06F 16/221 (2019.01); H04L 41/22 (2013.01);
Abstract

Methods and systems for performing advanced analytics based on which features are active by correlating information based on temporal identifiers in feature databases. The method includes receiving a request to change a feature, determining metadata information for the feature, which may include a temporal indicator, a performance metric and a configuration of activation states, and generating a feature change record based on this metadata. The method includes receiving a request to determine a second performance metric, processing the request by determining a second feature change record, determining a configuration and generating a recommendation for display.


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