The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Jan. 03, 2023
Applicant:

Rda Microelectronics (Beijing) Co., Ltd., Beijing, CN;

Inventors:

Yifu Luan, Beijing, CN;

Kai Li, Beijing, CN;

Liyun Luo, Beijing, CN;

Lichao Hu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/04 (2006.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 1/0475 (2013.01); H04B 17/21 (2015.01); H04B 2001/0425 (2013.01);
Abstract

The present disclosure provides an amplitude offset calibration method. The method includes: obtaining at least two test feedback signals, where the test feedback signals are analog signals obtained by a transmitter in a test mode according to a test signal, at least two test signals in one-to-one correspondence to the at least two test feedback signals are digital signals pre-generated by the transmitter, and amplitudes of the at least two test signals are different; obtaining at least two corresponding baseband signals according to the at least two test feedback signals, where the baseband signals are a digital signal, and the baseband signals are in one-to-one correspondence to the test feedback signals; and determining an amplitude offset value according to the at least two test signals and the at least two baseband signals.


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