The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Jun. 28, 2024
Applicant:

Wuhan Tianma Micro-electronics Co., Ltd., Wuhan, CN;

Inventors:

Li Qian, Wuhan, CN;

Panpan Li, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/20 (2006.01); G09G 3/00 (2006.01); G09G 3/3208 (2016.01);
U.S. Cl.
CPC ...
G09G 3/2007 (2013.01); G09G 3/006 (2013.01); G09G 3/3208 (2013.01); G09G 2320/041 (2013.01); G09G 2320/0673 (2013.01); G09G 2380/10 (2013.01);
Abstract

A Gamma debugging method includes: under a standard temperature condition, testing N reference samples to obtain standard Gamma data of the N reference samples with respect to a target Gamma curve; under test temperature conditions, testing the N reference samples to obtain reference Gamma data of the N reference samples; determining Gamma adjustment amounts of the reference samples under the test temperature conditions based on the reference Gamma data and standard Gamma data; establishing a relationship table between test temperatures and Gamma adjustment amounts; obtaining Gamma data at the standard temperature and current temperature information of a target sample; and, based on the Gamma data of the target sample at the standard temperature and the Gamma adjustment amount corresponding to the current temperature information, determining a current driving voltage value of the target sample.


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