The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Nov. 29, 2022
Applicant:

Cognex Corporation, Natick, MA (US);

Inventor:

Ivan Bachelder, Hillsborough, NC (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/60 (2013.01); G06T 2207/10028 (2013.01);
Abstract

The techniques described herein relate to methods, apparatus, and computer readable media for measuring object characteristics by interpolating the object characteristics using stored associations. A first image of at least part of a ground surface with a first representation of a laser line projected onto the ground surface from a first pose is received. A first association between a known value of the characteristic of the ground surface of the first image with the first representation is determined. A second image of at least part of a first training object on the ground surface with a second representation of the laser line projected onto the first training object from the first pose is received. A second association between a known value of the characteristic of the first training object with the second representation is determined. The first and second association for measuring the characteristic of a new object are stored.


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