The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Sep. 10, 2020
Applicants:

Flir Systems Ab, Täby, SE;

Flir Systems, Inc., Wilsonville, OR (US);

Inventors:

Erik Adam Urklinski, Täby, SE;

Anton Lof, Täby, SE;

Kristofer Vahlström, Täby, SE;

Assignee:

FLIR Systems AB, Taby, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01J 5/02 (2022.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G01J 5/026 (2013.01); G01J 5/027 (2013.01); G01J 2005/0077 (2013.01); G06T 2207/10048 (2013.01);
Abstract

System and methods for capturing infrared images for include infrared imaging components configured to capture infrared images of a scene, user input and output components include a display and at least one user input component, and a logic device configured to guide the user through an infrared image acquisition process to acquire an infrared image of an inspection area, and guide the user through an analysis of the captured infrared image to detect a condition visible in the infrared image of the inspection area. The user is guided through environmental and/or location considerations associated with the condition, instructed to prepare the location for infrared image acquisition, and guided through a process for analyzing captured images.


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