The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Aug. 23, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shaikh Shahriar Quader, Scarborough, CA;

Aindrila Basak, Edmonton, CA;

Adrian Mahjour, Toronto, CA;

Petr Novotny, Mount Kisco, NY (US);

Carlo Appugliese, Seminole, FL (US);

Berthold Reinwald, San Jose, CA (US);

Dheeraj Arremsetty, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/21 (2023.01); G06F 18/22 (2023.01); G06F 18/40 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/217 (2023.01); G06F 18/22 (2023.01); G06F 18/40 (2023.01);
Abstract

Providing a representative dataset from an initial dataset by accessing a dataset associated with a machine learning model, receiving input parameters associated with the representative dataset selection, the input parameters including an evaluation metric, determining a density of a plurality of datapoints associated with the dataset, training a first iteration of a machine learning model using a first data point selected according to the density, determining a first value of the evaluation metric for the first iteration of the machine learning model, generating a representative subset based on the first value of the evaluation metric value, and providing the representative dataset and a final machine learning model trained using the representative dataset.


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