The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
May. 17, 2022
Bank of America Corporation, Charlotte, NC (US);
Maharaj Mukherjee, Poughkeepsie, NY (US);
Prashant Thakur, Gujarat, IN;
Bank of America Corporation, Charlotte, NC (US);
Abstract
Apparatus and methods for detecting non-linear data dependencies in machine learning are provided. The methods may include receiving a data set comprising a plurality of data features, the data set for processing by a machine learning model operating on a machine learning system. The methods may also include plotting the data set in multi-dimensional space and linearizing the plotted, multi-dimensional space by feeding the plotted data to an algorithm programmed to execute the Delaunay triangulation method. The methods may further include receiving from the algorithm the data set linearized in a faceted space and detecting linear correlations in the linearized data set. The methods may additional include identifying a first data feature that has a correlation coefficient with a second data feature that is greater than an accuracy metric and removing the first data feature from the data set to create a reduced data set.