The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Dec. 08, 2023
Applicant:

Tealium Inc., San Diego, CA (US);

Inventors:

Ivan Batanov, Iii, San Diego, CA (US);

John Joshua Roach, San Diego, CA (US);

Assignee:

TEALIUM INC., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2455 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/24554 (2019.01);
Abstract

Systems and methods are provided for analysis and selection of attributes used to segment data entities. The attributes used to segment data entities may be analyzed to identify segments of data entities (e.g., distinct audiences of visitors) that share values for a given subset of attributes. By intelligently selecting attributes for use in the segmentation process based on the values that they may take (e.g., the cardinality of the attributes), the selected attributes can be used to generate a reasonable or otherwise desirable number of data entity segments. Other attributes can be excluded from the segmentation process.


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