The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Nov. 24, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Jun Shirakawa, Saitama, JP;

Akio Maruyama, Tokyo, JP;

Kei Inoue, Kanagawa, JP;

Waka Hasegawa, Tokyo, JP;

Yukio Nagase, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 9/097 (2006.01); C08F 212/08 (2006.01); C08F 220/28 (2006.01); C08K 3/30 (2006.01); C08K 5/42 (2006.01); C08K 5/544 (2006.01);
U.S. Cl.
CPC ...
G03G 9/09775 (2013.01); C08F 212/08 (2013.01); C08F 220/282 (2020.02); C08K 3/30 (2013.01); C08K 5/42 (2013.01); C08K 5/544 (2013.01); C08K 2003/3045 (2013.01);
Abstract

External additive particles including a polymer containing a sulfur atom and a nitrogen atom, wherein the polymer includes a vinyl polymer moiety and a siloxane moiety, relative to a total number of carbon atoms, oxygen atoms, and silicon atoms constituting the external additive particles, a ratio of a number of the silicon atoms constituting the external additive particles is 4.0% or more and 25.0% or less, and in surfaces of the external additive particles analyzed by X-ray photoelectron spectroscopy, relative to a total number of carbon atoms, nitrogen atoms, oxygen atoms, silicon atoms, and sulfur atoms, a ratio of a number of the nitrogen atoms is 0.40% or more and 2.50% or less, and a ratio of a number of the sulfur atoms is 0.05% or more and 0.25% or less.


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