The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Sep. 24, 2019
Denka Company Limited, Tokyo, JP;
Chihfang Tien, Niigata, JP;
Risa Kohiyama, Niigata, JP;
Tomomi Takano, Niigata, JP;
Takashi Miyazawa, Niigata, JP;
DENKA COMPANY LIMITED, Tokyo, JP;
Abstract
A diagnostic testing device is a testing-device for immunochromatography wherein a liquid sample contains an analyte developed in a detection area via a labeling-substance-containing area of a test strip, and a negative or positive interpretation is made from the coloration exhibited by the detection area. The device includes a measuring part for obtaining data on a coloration index associated with coloration state for at least part of the detection area, and a processing part that interprets based on the coloration index data. The processing part delivers a negative interpretation if the coloration state of the analyte detection area is in a negative state in at least one image out of a maximum of N (wherein N is greater than 1) obtained images, and delivers a positive assessment if the coloration state of the analyte detection area is in a positive state in all N images.