The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Jan. 20, 2023
Nabtesco Corporation, Tokyo, JP;
Kazuhiko Sakurai, Tokyo, JP;
Masaki Harada, Tokyo, JP;
NABTESCO CORPORATION, Tokyo, JP;
Abstract
An abnormality detecting device includes at least two first cover parts arranged next to each other in a circumferential direction; electrode parts respectively supported by the first cover parts; magnet parts provided inside of the first cover parts in the radial direction, where each magnet part is in contact with a corresponding electrode part; and a second cover part provided between adjacent first cover parts in the circumferential direction. An inter-electrode creepage distance between adjacent electrode parts in the circumferential direction is less than an inter-magnet creepage distance between adjacent magnet parts in the circumferential direction, the inter-electrode creepage distance being directed along outer peripheral surfaces of the first cover parts and an outer peripheral surface of the second cover part, and the inter-magnet creepage distance being directed along respective sides of the second cover part in the circumferential direction and the outer peripheral surface of the second cover part.