The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Jul. 30, 2023
Fujifilm Corporation, Tokyo, JP;
Sohichiro Nakamura, Kanagawa, JP;
Kenichi Hamada, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided is an optical measurement device capable of easily measuring a scattering intensity at different scattering angles or different wavelengths. An optical measurement device with a low-coherence interferometer includes a detection unit having at least one of a first detection unit that detects an interference light intensity per wavelength by means of interference between at least a part of scattered light obtained by allowing incident light to be incident on a dispersion liquid including particles and reference light or a second detection unit that detects an interference light intensity per scattering angle by means of interference between at least a part of the scattered light obtained by allowing the incident light to be incident on the dispersion liquid including the particles and the reference light, and a conversion unit extracts a scattering intensity at a specific depth and a specific wavelength of the dispersion liquid from data of the interference light intensity per wavelength detected by the first detection unit or a scattering intensity at a specific depth and a specific scattering angle of the dispersion liquid from data of the interference light intensity per scattering angle detected by the second detection unit and converts data of the extracted scattering intensity into time fluctuation data of the scattered light at the specific depth of the dispersion liquid.