The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Jun. 12, 2023
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Assignee:
Sysmex Corporation, Hyogo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/30 (2006.01); G01N 1/28 (2006.01); G01N 33/49 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 1/2813 (2013.01); G01N 1/30 (2013.01); G01N 33/49 (2013.01); G06T 7/0002 (2013.01);
Abstract
Disclosed is a control method for a test system including a smear imaging unit configured to image a smear of a specimen, the control method including: preparing a plurality of the smears; sequentially storing, in a storing container capable of storing therein a plurality of the smears, the smears having been prepared; and transporting, when information about a standby situation for imaging processing by the smear imaging unit satisfies a predetermined condition, the storing container that stores therein the smears to the smear imaging unit regardless of the number of the smears stored in the storing container.