The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Jul. 29, 2021
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Hirotaka Oka, Tokyo, JP;

Masumi Nomura, Tokyo, JP;

Tatsuo Ishiguro, Tokyo, JP;

Katsuaki Morita, Tokyo, JP;

Ryuji Ikeda, Tokyo, JP;

Kenichi Nagahara, Tokyo, JP;

Sota Kogawa, Tokyo, JP;

Noriyuki Matsukura, Tokyo, JP;

Satoshi Nikaido, Tokyo, JP;

Yuki Nishizaki, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

An abnormality diagnosis device includes an abnormality determination unit configured to determine whether or not there is an abnormality with respect to a state quantity acquired from equipment and a cause estimation unit configured to estimate a cause of the abnormality in the equipment from a state quantity determined to be abnormal by the abnormality determination unit using a cause correspondence table in which a cause of an abnormal mode of the equipment identified in fault tree analysis is associated with the state quantity that is abnormal when the cause has occurred.


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