The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Nov. 07, 2022
Applicant:
Thermo Electron Scientific Instruments Llc, Madison, WI (US);
Inventors:
Yan Min, Verona, WI (US);
Francis J Deck, Madison, WI (US);
Assignee:
Thermo Electron Scientific Instruments LLC, Madison, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G02B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0208 (2013.01); G02B 21/04 (2013.01);
Abstract
Provided are systems and methods related to hybrid reflective microscope objectives and lens systems used in a spectroscopy system. The objective lens system includes a primary aspheric mirror having a first R-value; and a secondary aspheric mirror having a second R-value smaller than the first R-value, where in the objective lens system has a working distance of at least 20 mm and a numerical aperture of 0.29-0.65, and wherein surfaces of the primary and secondary aspheric mirrors have a non-zero sixth order aspheric parameter.