The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Aug. 31, 2023
Applicant:

Leica Geosystems Ag, Heerbrugg, CH;

Inventors:

Marcel Rüegg, Baden, CH;

Matthias Wolf, Suhr, CH;

Assignee:

LEICA GEOSYSTEMS AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 11/02 (2006.01); G01C 11/18 (2006.01); G01S 7/51 (2006.01); G01S 17/894 (2020.01);
U.S. Cl.
CPC ...
G01C 15/002 (2013.01); G01C 11/025 (2013.01); G01C 11/18 (2013.01); G01S 7/51 (2013.01); G01S 17/894 (2020.01);
Abstract

A selective laser scanner, comprising a target component which can be rotated about two rotation axes and is configured to transmit a distance measuring beam defining a target axis. The selective laser scanner further comprises a distance measuring unit configured to carry out distance measurements by means of the distance measuring beam on cooperative targets or on diffusely scattering targets. The selective laser scanner is equipped with a plurality of overview cameras arranged on the target component offset from the target axis in a fixed positional arrangement with respect to each other having field of views which at least partly overlap each other. The selective laser scanner further comprises a display for displaying an environment image provided by imaging data of at least one of the cameras as well as automatic feature and area detections.


Find Patent Forward Citations

Rüegg, Marcel. (2025). Laser scanner with stereo camera vision for improved selective feature scanning (U.S. Patent No. 12492894). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12492894

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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