The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Jan. 20, 2022
Applicant:

Denso Wave Incorporated, Chita-gun, JP;

Inventor:

Shoji Katsura, Chita-gun, JP;

Assignee:

DENSO WAVE INCORPORATED, Aichi-Pref., JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G01B 11/02 (2013.01);
Abstract

A three dimensional measurement system has a measurement unit that images the measuring object and that has a light projecting device projecting projected light onto the measuring object and a light receiving device receiving the reflected light. The system has a specular reflection member that forms a mounting surface for mounting the measuring object and reflects projected light at a specific angle. The system has a data acquisition unit that acquires imaging data and a coordinate calculation unit that calculates three dimensional coordinates for the part of the imaging data whose brightness is higher than the lower limit brightness and does not calculate three dimensional coordinates for the part whose brightness is lower than the lower limit brightness. The light receiving device is arranged at a position where the brightness of the part where the specular reflection member is imaged is lower than the lower limit brightness.


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