The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Sep. 18, 2020
Applicant:
Dwfritz Automation, Llc, Wilsonville, OR (US);
Inventors:
Shawn A. Boling, Wilsonville, OR (US);
Bhaskar Ramakrishnan, Wilsonville, OR (US);
Derek Graham Aqui, Wilsonville, OR (US);
Chris Barns, Wilsonville, OR (US);
Assignee:
Industrial Metrology Solutions LLC, Mebane, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 9/02015 (2022.01); G01B 9/0209 (2022.01); G01B 11/12 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01B 9/02015 (2013.01); G01B 11/12 (2013.01); G01B 11/2518 (2013.01); G01B 9/0209 (2013.01);
Abstract
Disclosed is a non-contact optical measurement device for detecting or measuring different geometric workpiece features based on configurable light-propagation paths of light emitted from a light source and reflected by a workpiece surface for incidence upon a spectral sensor. The light-propagation paths are configurable based on which optical probe is attached to a rotation stage that rotates the probe about an optical axis and in a collimated region.