The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2025

Filed:

Mar. 31, 2025
Applicant:

Visionnav Robotics Usa Inc., Acworth, GA (US);

Inventors:

Tingwei Wu, Acworth, GA (US);

Bingchuan Yang, Acworth, GA (US);

Yongxian Zeng, Acworth, GA (US);

Assignee:

VisionNav Robotics USA, Inc., Acworth, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B66F 9/075 (2006.01); B66F 9/06 (2006.01); G01S 17/89 (2020.01); G05D 1/86 (2024.01); G05D 105/20 (2024.01); G05D 107/70 (2024.01); G05D 109/10 (2024.01); G05D 111/10 (2024.01);
U.S. Cl.
CPC ...
B66F 9/0755 (2013.01); B66F 9/063 (2013.01); G01S 17/89 (2013.01); G05D 1/86 (2024.01); G05D 2105/20 (2024.01); G05D 2107/70 (2024.01); G05D 2109/10 (2024.01); G05D 2111/17 (2024.01);
Abstract

Disclosed are a method for determining a stacking state, a controller, and material handling equipment. The technical solution includes: acquiring target data of a first stacking object and a second stacking object; extracting, from the target data, first target data of the first stacking object and second target data of the second stacking object; extracting a first boundary of the first stacking object based on the first target data, and extracting a second boundary of the second stacking object based on the second target data; and calculating a width of a first gap between the first stacking object and the second stacking object based on the first boundary and the second boundary, and comparing the width of the first gap with a first threshold to determine a first stacking state. The present disclosure may help improve efficiency and accuracy of a determining process of a stacking state.


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