The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Jul. 24, 2023
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Yuto Maeda, Kyoto, JP;
Kana Kojima, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/40 (2024.01); A61B 6/42 (2024.01); A61B 6/46 (2024.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/463 (2013.01);
Abstract
An X-ray phase imaging apparatus includes an X-ray source; a detector; a plurality of gratings; an image processor configured to generate two or more types of first phase contrast images selected from absorption, differential phase and dark-field images as preview images under an imaging condition simpler than an imaging condition for a second phase contrast image to be captured in actual imaging; and a controller configured to display the first phase contrast images on a display.
Maeda, Yuto. (2025). X-ray phase imaging apparatus and display method of preview image in x-ray phase imaging apparatus (U.S. Patent No. 12490948). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12490948
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile